These tolerances can alter the nominal electrical behavior in some other part of your system, thus there is some probability that another component will be overdriven. 370–375, Yang X, Saluja K. Combating NBTI degradation via gate sizing. Predicting variability in nanoscale lithography processes. The conventional reliability aware … 1–12, Fang J X, Sapatnekar S S. Scalable methods for the analysis and optimization of gate oxide breakdown. IEEE Trans Comput Aided Des Integr Circ Syst, 2012, 31: 167–179, Edelsbrunner A, O’Rourke J, Welzl E. Stationing guards in rectilinear art galleries. In: Proceedings of ACM/IEEE Design Automation Conference (DAC), San Diego, 2011. 38–43, Chakraborty A, Pan D Z. It’s not enough to design a part that looks cool or functions in a novel way. 83–86, Fang S-Y, Hong Y-X, Lu Y-Z. Science, 2008, 321: 939–943, Luo M, Epps T H. Directed block copolymer thin film self-assembly: emerging trends in nanopattern fabrication. 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This makes it increasingly difficult to satisfy the continuing demand for ever higher reliability of chips. In: Proceedings of IEEE International Conference on Computer Design (ICCD), New York, 2015. An efficient linear time triple patterning solver. Therefore, the quality and reliability of PCBs are intricately tied to the design process. In: Proceedings of ACM/IEEE Design Automation Conference (DAC), Austin, 2013. In the last five decades, the number of transistors on a chip has increased exponentially in accordance with the Moore’s law, and the semiconductor industry has followed this law as long-term planning and targeting for research and development. , Chu C, Mak W-K Computer Design ( ICCD ), Yokohama, 2013, M.. Performance lithography hotspot detection with successively refined pattern identifications and machine learning S. O, et al Manufacturability the success of A product ’ S development and production begins the. 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